利用同步輻射光源對奈米材料進行X光吸收光譜研究，包括X光近緣結構（可以用來檢測材料中特定原子之電子組態）及延伸X光吸收精細結構（可用來測定原子之區域結構）兩大部份。在本文中我們介紹了X光吸收光譜的基本原理，並以本研究群對一些奈米材料之研究，如氣凝合成法或放電加工法合成TiO2及WO3之合金粉末、化學合成法合成RuO2薄膜及機械化學合金法合成FeS合金粉末等，做實例說明。經由X光吸收光譜在原子短程結構及電子組態分析上之優點，與傳統XRD長程有序分析結果相互配合，可使我們更加了解奈米材料之結構特性。
Using synchrotron X-ray sources to investigate nanocrystalline materials by X-ray absorption spectroscopy include X-ray Absorption Near Edge Structure (i.e., XANES, which reveals the electronic structures of the detected atom) and Extended X-ray Absorption Fine Structure (EXAFS, which examines the local atomic environment of detected atom). In the current work, we introduced the principles of X-ray absorption spectroscopy and characterized nanocrystalline materials by this technique. The investigated nanocrystalline materials include TiO2 and WO3 powders prepared by either a gas condensation or arc-discharging technique, RuO2 film deposited by a cyclic voltammetric method, and FeS powders synthesized by mechanochemical reaction. A combination of synchrotron X-ray absorption spectroscopy and traditional X-ray diffraction results can better reveal the structure of nanocrystalline materials.
