文化大學機構典藏 CCUR:Item 987654321/35422
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    Please use this identifier to cite or link to this item: https://irlib.pccu.edu.tw/handle/987654321/35422


    Title: Dual-wavelength optical fluidic glucose sensor using time series analysis of D(+)-glucose measurement
    Authors: Tang, JY (Tang, Jing-Yau)
    Chen, NY (Chen, Nan-Yueh)
    Chen, MK (Chen, Ming-Kun)
    Wang, MH (Wang, Min-Haw)
    Jang, LS (Jang, Ling-Sheng)
    Contributors: 電機系
    Keywords: DIABETIC-PATIENTS
    SPECTROSCOPY
    SPECTRA
    OBESITY
    Date: 2016-10
    Issue Date: 2017-02-17 11:24:02 (UTC+8)
    Abstract: This paper presents a rising-edge time-series analysis (TSA) method that can be applied to a dual-wavelength optical fluidic glucose sensor (DWOFGS). In the experiment, the concentration of glucose in phosphate buffered saline (PBS) was determined by measuring the absorbance of the solution as determined by variation in the rising edge of the photodiode (PD) voltage response waveform. The DWOFGS principle is based on near-infrared (NIR) absorption spectroscopy at selected dual wavelengths (1450 and 1650 nm) in the first overtone band. The DWOFGS comprises two light-emitting diodes (LEDs) and two PD detectors. No additional fibers or lenses are required in our device. The output light level of the LEDs is adjusted to a light intensity suitable to the glucose absorption rate in an electronic circuit. Four light absorbance paths enable detection of D(+)-glucose concentrations from 0 to 20wt% in steps of 5wt%. The glucose light absorbance process was calculated based on the rising edge of the PD waveform under a low-intensity light source using TSA. The TSA method can be used to obtain the glucose level in PBS and reduce measurement background noise. The application of the rising-edge TSA method improves sensor sensitivity, increases the accuracy of the data analysis, and lowers measurement equipment costs. (C) 2016 The Japan Society of Applied Physics
    Relation: JAPANESE JOURNAL OF APPLIED PHYSICS 卷: 55 期:10 文獻號碼: 106601
    Appears in Collections:[Department of Electrical Engineering ] journal articles

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