探針尖端由率半徑對測量粗糙表面之影響

CCUR > College of Natural Science and Engineering > College of Engineering > College of Engineering > Chinese Culture University Hwa Kang Journal of Engineering > Item 987654321/28788

Please use this identifier to cite or link to this item: https://irlib.pccu.edu.tw/handle/987654321/28788

Title:	探針尖端由率半徑對測量粗糙表面之影響 The Effect of the Curvature of Stylus Tip on Measuring Rough Surfaces
Authors:	Wu), 吳俊仲(Jiunn-Jong
Contributors:	華岡工程學報
Keywords:	探針表面粗糙度頻譜 stylus surface roughness spectral density
Date:	1998-05
Issue Date:	2014-11-04 13:22:10 (UTC+8)
Abstract:	本研究假設一般粗糙表面，研究探針尖端曲率半徑對測量此表面的影響。從幾何以及頻譜等方面來看表面粗糙度的問題，分析探針測得出的表而的粗糙度與真實表面粗糙度的差別。結果發現，探針測量的精確度與atuo-correlation function有很密切的關係。 The object of this research is to investigate the effect of stylus tip on measuring rough surfaces from the viewpoint of geometric and spectral analyses and compare the roughness of measured surface and that of the original surface. It is found that the accuracy of measurement strongly depends on the auto-correlation function.
Relation:	華岡工程學報； 12 期 (1998 / 05 / 01) ， P63 - 80
Appears in Collections:	[College of Engineering] Chinese Culture University Hwa Kang Journal of Engineering

Files in This Item:

File	Description	Size	Format
index.html		0Kb	HTML	296	View/Open

View Licence