English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 46833/50693 (92%)
造訪人次 : 11867282      線上人數 : 632
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    主頁登入上傳說明關於CCUR管理 到手機版


    請使用永久網址來引用或連結此文件: https://irlib.pccu.edu.tw/handle/987654321/20946


    題名: A band-type network model for the time-series problem used for IC leadframe dam-bar shearing process
    作者: Lin, ZC (Lin, Zone-Ching)
    Chang, DY (Chang, Dar-Yuan)
    貢獻者: 機械系
    關鍵詞: Progressive shearing process
    Time-series problem
    Neural networks
    Taguchi's method
    日期: 2009-02
    上傳時間: 2011-12-09 14:27:42 (UTC+8)
    摘要: Progressive shearing process of a thin metal sheet is regarded as one of the most important fabrication processes in the 3C industry. In this process, the problem of punch wear is a time-series issue that would be changed along with the increase of time and deciding the size of the punched hole. This study proposes a neural network to modeling the time-series problem involving three kinds of presentations. First, the time-characteristic diagram is plotted based on the characteristic values that the network inferred. Second, the characteristic value of the un-examined time could be derived by network inferring. Third, a band-type diagram is built to present the possible variation range of the characteristic analyzed. Two cases of punch wearing band and punched hole bands for IC (integrated circuit) leadframe dam-bar shearing process are discussed to demonstrate the construction of the network model. The verification experiments show that the network inferring results are in agreement with the actual process, and derive more accurate predictions than that of the curve-fitting methods commonly used in engineering.
    顯示於類別:[機械工程系暨機械工程學系數位機電研究所] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML611檢視/開啟


    在CCUR中所有的資料項目都受到原著作權保護.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回饋